Japanese Government Procurement
National University Corporation - Notice of request for submission of materialsScanning Electron Microscope for Cryo-Electron Tomography 1 Set
This procurement is covered by the WTO Agreement on Government Procurement, Japan-EU Economic Partnership Agreement or Japan-UK Comprehensive Economic Partnership Agreement.
| Publishing date | Mar 27, 2023 |
|---|---|
| Type of notice | Notice of request for submission of materials |
| Procurement entity | National University Corporation - Miyagi |
| Classification |
0024 Professional/Scientific & Controlling Instruments & Apparatus |
| Summay of notice | ⑴ Classification of the products to be procured : 24 ⑵ Nature and quantity of the products to be purchased : Scanning Electron Microscope for Cryo-Electron Tomography 1 Set ⑶ Type of the procurement : Purchase ⑷ Basic requirements of the procurement : ① Cryo Focused ion beam-Scanning electron microscope (FIB-SEM) 1) Focused ion beam with a liquid gallium ion source should be equipped for fine milling. 2) An in-lens-type thermal Schottky field emission gun should be equipped, and the emitter should be worked without the need of exchange for more than 3 years. 3) The retractable reflected electron detector located just below the SEM column can be inserted, when the stage is tilted by 50 degree or more at the coincident point. 4) The temperature of the cryo-stage should be controllable at the range from -150℃ to 20℃ using liquid nitrogen. ② Light microscope for cryo-correlative microscopy 1) The cryo-stage cooled by liquid nitrogen should be equipped. 2) The bright field images can be overlapped with the fluorescence images. 3) The objective lens with 100 times magnification or higher should be equipped. ③ Coordinate linkage system This system is necessary for obtaining cryo-electron tomography images using the 300kV transmission electron microscope (CRYO ARM 300 II, JEOL), installed in the Advanced Research Center for Innovations in Next-Generation Medicine (INGEM), Tohoku University. 1) By using the same cartridge cooled by liquid nitrogen, coordinates should be linked among the light microscope for cryo-correlative microscopy ②, the cryo focused ion beam-scanning electron microscope ①, and the 300kV transmission electron microscope (CRYO ARM 300 II, JEOL). ④ Sample preparation device for FIB-SEM 1) Sputter coating of samples should be possible at atmospheric temperature of liquid nitrogen, and the samples should be possible to be transferred to the cryo focused ion beam-scanning electron microscope ①. 2) Quickly frozen samples can be set on sample folders in the liquid nitrogen bath, and the samples should be possible to be transferred to the cryo focused ion beam-scanning electron microscope ①. ⑤ High-pressure freezing sample preparation device for FIB-SEM for cryo electron microscopy 1) Freeze fracture, freeze etching, and electron beam coating should be possible. 2) Freezing of aqueous samples should be possible under high pressure at 55% relative humidity. ⑥ Automated grid plunging device 1) The temperature of the environmental chamber should be controllable at the range from 5℃ to 50℃. 2) The container should keep liquid nitrogen of 1L or more for one hour or longer. ⑦ Cryo Workstation 1) Sample fixing mechanism should be provided to fix the sample to the cartridge using liquid nitrogen as a medium. ⑸ Time limit for the submission of the requested material : 17 : 00 27 April, 2023 ⑹ Contact point for the notice : Shigehiro Akiyama, Procurement Services Office, Fi-nance Department, Tohoku University, 2-1-1 Katahira Aoba-ku Sendai-shi 980-8577 Japan, TEL 022-217-4869 |
