Online Trade Fair Database (J-messe)
Latin American & Caribbean Tyre Expo and Latin Auto Parts Expo 2024
Date | July 31, 2024 - August 2, 2024 |
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City / Country |
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Venue |
Panama Convention Center
Expected floor size :50,000 sq.m.
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Items to be exhibited | Tires New & Used (PCR/TBR/OTR/AGRI/IND), Tire Equipment & Service Repair, Lubricants & Car Care, Retreading Casings, Tubes, Tuning & Audio, Remanufactured Auto Parts, Heavy Equipment, Auto Parts, Tools, Related Equipment |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
Latin American & Caribbean Tyre Expo, LLC.
Address : 9840 SW 77th Ave., Suite No. 203, Miami FL 33156 USA Tel : +1-786-293-5186 E-mail : info@latinexpogroup.com Inquiry Form : https://www.latintyreexpo.com/contact/ |
Message from organizer |
The LATIN TYRE EXPO and the LATIN AUTO PARTS EXPO are the most important tire and auto part shows in Latin America and the place to be if you want to grow your business in Latin America and the Caribbean! Almost 400 international exhibitors will be present, from tire manufacturers, tire service and repair companies, retreading, wheels, auto part manufacturers, auto service, tools, and equipment, etc. Educational and training sessions with top industry leaders, networking events, and much more are included with your registration.
Held with a concurrent exhibition. |
Industry | |
Frequency | Annual |
last fair information |
2023 year Total number of visitors : 4000 Total number of exhibitors : 500 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | December 26, 2023 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.