Online Trade Fair Database (J-messe)
JPCA Show 2023 (International Electronic Circuits Exhibition) - Module Japan
Date | May 31, 2023 - June 2, 2023 |
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Location |
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Venue |
Tokyo Big Sight |
Items to be exhibited | Various straight, package, interposer, built-in electronic circuit board, WLCSP / WLP, BGA (CSP), LGA, QFN, chip parts, bare die, various modules, function & logic design technology, other various design & support tools, electromagnetic field analysis (EMC / EMI / SI measures), CAE support equipment such as CAD & CAM & CIM, inspection & evaluation & analysis system, various alloys, wiring & board material, polyimide film / tape, ceramic substrate material, silicon wafer, glass blanks, plating & mold Manufacturing technology, materials and equipment, chemical processing, photographic exposure equipment, machining, transport, coating, washing, etc., various manufacturing equipment, environmental and energy saving systems, logistics systems, inventory management systems, security, traceability management, etc. |
For Visitors |
Eligibility : Trade & general public
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
JPCA
Tel : +81-3-5310-2020 E-mail : show@jpca.org |
Message from organizer | Held with concurrent exhibitions. |
The representative office, person or agency in Japan |
JTB Communication Design, Inc. Tel : +81-3-5657-0767 E-mail : jpcashow@jtbcom.co.jp |
Industry |
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Frequency | Annual |
last fair information |
2022 year Total number of visitors : 27972 Total number of exhibitors : 313 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | December 27, 2022 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.