Online Trade Fair Database (J-messe)
Smart Cold Chain Expo 2022
Date | December 1, 2022 - December 3, 2022 |
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Location |
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Venue |
HITEX Exhibition Centre
Expected floor size :2,500 sq.m.
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Items to be exhibited | Cold Storage, Infrastructure Solutions, Packaging and Labeling Solutions, Cold Transport, Cold Supply Chain, Alternate Energy Solutions for Cold Storage and Warehouses, Material Handling & Storage, Technology Solutions, Safety & Security Solutions, Retail Display Solutions, Facility Management Solutions, Refrigeration, Processing Solutions |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
Future Market Events
Tel : +91-9971108657 E-mail : info@futuremarketevents.com |
Message from organizer | Smart Cold Chain Expo is India's only dedicated event covering the entire value chain of cold logistics, temperature-controlled warehousing, and cold supply chain. Taking place in Hyderabad from 1-3 December 2022 at HITEX Exhibition Centre, the expo and conference will gather the end-users, buyers, and service providers looking to explore the new business, networking, and learning opportunities. The event will be attended by the entire spectrum of end-users and stakeholders, including cold storage owners/operators, progressive farmers, consultants and institutions, and end-user companies from a variety of sectors to source new-to-market & innovative solutions for their cold storage, manufacturing units and to enhance their cold supply chain operations. |
Industry | |
Frequency | Annual |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | November 11, 2022 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.