Online Trade Fair Database (J-messe)
35th International Optical Fair Tokyo -IOFT 2022-
| Date | October 18, 2022 - October 20, 2022 |
|---|---|
| City / Country |
Tokyo
/
Japan
/
Asia
|
| Venue |
Tokyo Big Sight |
| Items to be exhibited | Frames, Sunglasses, Lenses, Accessories, Examination/Testing Equipment, Machines, Contact Lenses, Hearing Aids, IT Systems (Customer Management/Sales Management/Anti-theft, etc.) |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online / Others : Admission Fee: JPY 5,000/person without invitation ticket For details, please contact the organizer directly. |
| Organizer |
Organiser : RX Japan Ltd. (Formerly Reed Exhibitions Japan Ltd.)
Tel : +81-3-3349-8508 E-mail : ioft.jp@rxglobal.com |
| Message from organizer | When the first trade fair was held in 1998, many people in the industry said that a trade fair was just a place for PR and not for business meetings. However, over the years, RX JAPAN has transformed itself into a full-fledged trade fair where exhibitors and visitors are able to purchase and sell products onsite after we persuaded them. Today, it has grown to become one of the largest international optical fair in Asia, bringing together major companies from 17 countries, including Italy, Germany, France, and the United States, as well as Japan, and business meetings during the fair amounted to JPY 6.7 billion. |
| Industry |
|
| Frequency | Annual |
| last fair information |
2021 year Total number of visitors : 5863 Total number of exhibitors : 189 The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | May 6, 2022 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
