Online Trade Fair Database (J-messe)
Maintenance & Resilience TOKYO 2022 - AI / IoT / 5G / System / Tool Special Feature for the Civil Engineering / Construction Industry
Date | July 20, 2022 - July 22, 2022 |
---|---|
City / Country | Tokyo / Japan / Asia |
Venue |
Tokyo Big Sight -East Exhibition Halls- |
Items to be exhibited | Products and services related to data management & management support & site support systems / tools aimed at improving & improving production efficiency & work efficiency for civil engineering & construction |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
Japan Management Association
Tel : +81-3-3434-1988 E-mail : mente@jma.or.jp |
Message from organizer |
At civil engineering, construction, manufacturing, and other sites, it is difficult to maintain / improve quality due to a shortage of engineers / workers due to labor shortage / aging / retirement of skilled workers, etc., and productivity improvement is an urgent issue. There is an urgent need to improve work efficiency. In order to meet the demands of the industry, we will hold a special feature that displays systems / tools aimed at improving and improving production efficiency and work efficiency at civil engineering and construction sites.
Held with concurrent exhibitions. |
Industry |
|
Frequency | Annual |
last fair information |
2021 year Total number of visitors : 12818 Total number of exhibitors : 220 The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | May 6, 2022 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.