VISION 2022 - Machine Vision Trade Fair

Date October 4, 2022 - October 6, 2022
City / Country Stuttgart / Germany / Europe・CIS
Venue Messe Stuttgart
Items to be exhibited Application-specific machine vision systems, Configurable machine vision systems, Smart cameras, Vision sensors, Illumination, Laser, Optics / lenses, Optical filters, Cameras, Area scan cameras, Line scan cameras, High-speed cameras, Infrared cameras, Hyperspectral cameras, X-ray cameras, CIS/LDIS (Contact image sensors / Lowdistance image sensors), Optical sensors, Frame grabbers / acquisition boxes, Software libraries, Software application packages, Configurable Machine Vision Software, Processors and computer components, Measuring systems for machine vision, Cables and connectors, Camera protective enclosures and mounting devices, Auxiliary materials, Accessories, Barcode identification, 2D code identification, Optical character recognition (OCR / OCV), Security systems, Recognition of objects / type recognition, Position identification, Sequence analysis, Quality inspection, Colour inspection, Completeness check / assembly control, Print inspection, Texture analysis, etc
For Visitors Eligibility : Trade only
Method of admission : Apply/register online
For details, please contact the organizer directly.
Organizer Landesmesse Stuttgart GmbH
Address : Messepiazza 1, 70629 Stuttgart
Tel : +49-711-18560-0
E-mail :
Frequency Once in 2 years
last fair information 2021 year
Total number of visitors : 5400
The past records may include concurrent/joint exhibits.
Official website For more detailed information of the trade fair, please check the official website External site: a new window will open. of the individual organizer.
last update April 14, 2022

Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.