Online Trade Fair Database (J-messe)
Automotive Testing Expo 2022
Date | October 25, 2022 - October 27, 2022 |
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Location |
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Venue |
Suburban Collection Showplace |
Items to be exhibited | Full vehicle testing, Every type of data capture, Autonomous vehicle simulation, Autonomous vehicle test & validation, 5G and communications test & verification, ADAS testing, Electric powertrain testing, Internal combustion engine & hybrid testing, Range testing, EMC testing, NVH analysis, Aerodynamics modeling & testing, Suspension & chassis testing and rigs, Electrical systems & battery testing, Electronics testing, Acoustic modeling & testing, Environmental testing, Toxicity analysis, Structure & fatigue testing, Sensors & transducers, Wind tunnel technology, Materials testing, Full vehicle test rigs, vibration & shock testing, Crash test technology, Test simulation, Occupant/pedestrian safety, Engine/emissions testing, Track simulation and laboratory testing, Dynamometers, Vehicle dynamics testing, Materials testing, Aerodynamic and wind tunnel testing, Vibration and shock testing, Acoustic testing, Mechanical testing, Hydraulics testing, Electrical system testing, etc |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
UKi Media & Events
Tel : +44-1306-743744 E-mail : registration@ukimediaevents.com |
Industry |
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Frequency | Annual |
last fair information |
2019 year Total number of visitors : 6000 Total number of exhibitors : 370 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | April 4, 2022 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.