Online Trade Fair Database (J-messe)
Japan SMEs Tech & Services 2021
Date | December 8, 2021 - December 10, 2021 |
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City / Country | Tokyo / Japan / Asia |
Venue |
Tokyo Big Sight |
Items to be exhibited | New products, services, technologies |
For Visitors |
Eligibility : Trade & general public
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
National Federation of Small Business Associations
Tel : +81-3-5946-8843 E-mail : tenji@shin-monodukuri-shin-service.jp |
Message from organizer | This is an exhibition and business meeting where small and medium-sized enterprises nationwide repeatedly take on challenges, such as new products, services, and technologies developed by utilizing the "manufacturing assistance business," and bring together the results of various fields with ingenuity. The results of bold challenges of small and medium-sized enterprises are accumulated, such as product processing that was finally reached by repeating trial production, material development that was realized by working with a completely new idea, and detailed services that could only be realized by small and medium-sized enterprises. This is a free admission (pre-registration system) event that we would like people who want to utilize the results produced by the strength of small and medium-sized enterprises to participate. |
Industry | |
Frequency | Annual |
last fair information |
2019 year Total number of visitors : 17926 Total number of exhibitors : 539 The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | June 24, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.