Online Trade Fair Database (J-messe)
1st Nursery ICT Expo Osaka
| Date | June 23, 2021 - June 25, 2021 |
|---|---|
| Location |
Osaka (Osaka)
/
Japan
/
Asia
|
| Venue |
INTEX Osaka |
| Items to be exhibited | Operation Support Services, Children Management System, Transfer Bus Management, Digital Teaching Materials, Work-style Innovation Support, ICT Equipment etc. |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online / Others : Admission fee: JPY 5,000/person without invitation ticket. For details, please contact the organizer directly. |
| Organizer |
Organiser: Reed Exhibitions Japan Ltd.
Tel : +81-3-3349-8749 E-mail : edix@reedexpo.co.jp |
| Message from organizer |
Nursery schools and kindergartens are increasingly adopting ICT for the safety and security of children, and to improve the working environment for nursery staff and workers. Staff and teachers from nursery schools, kindergartens, children's schools, and local governments will visit the show to compare a wide range of products including kindergarten attendance management, monitoring systems, and support services for kindergarten operations. By holding a new trade fair in Osaka to help reform the way nursery school teachers work, the fair will contribute to improving the environment for nursery schools and kindergartens, especially in western Japan.
Held with concurrent exhibitions. |
| Industry |
|
| Frequency | Twice a year |
| last fair information |
2019 year Total number of visitors : 9318 The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | July 16, 2020 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
