Online Trade Fair Database (J-messe)
1st Material DX Expo
| Date | September 30, 2026 - October 2, 2026 |
|---|---|
| Location |
Chiba (Chiba)
/
Japan
/
Asia
|
| Venue |
Makuhari Messe |
| Items to be exhibited | MI (Materials Informatics), materials simulation software, experimental data collection/management systems, materials analysis x AI/machine learning, LCA software, patent search efficiency systems, generative AI, no-code AI tools, automatic label generation tools, digital talent development, manual creation, video creation, process informatics, DX/AI utilization for factories/plants, digital twin technology, chemical substance management software, ESH management cloud, legal and regulatory databases, SDS software, OCR analysis function, legal and intellectual property tools, sales support tools, marketing DX, inventory management tools, distribution efficiency tools, ERP tools |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
RX Japan GK
Tel : +81-3-6631-7576 E-mail : mw-vis.jp@rxglobal.com |
| Message from organizer |
We will be holding a new exhibition in September 2026 to promote DX in the materials industry, encompassing research, manufacturing, and sales. Exhibits will include R&D tools such as MI (Materials Informatics), process informatics, chemical substance management software, sales support and inventory management tools, and other DX and AI solutions.
Held with concurrent exhibitions. |
| Industry |
|
| Frequency | Annual |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | March 31, 2026 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
