Online Trade Fair Database (J-messe)
28th China Hi-Tech Fair (CHTF)
| Date | November 26, 2026 - November 28, 2026 |
|---|---|
| Location |
Shenzhen
/
China
/
Asia
|
| Venue |
Shenzhen World Exhibition & Convention Center
Expected floor size ：40,000 sq.m.
|
| Items to be exhibited | Heavy Equipment, Technology, AI & Robots, Infrastructure & Big Data, Clean Energy, Machinery Manufacturing, Medical Devices, Medicine & Medical Laboratory, Environmental Protection, Green & Low-carbon, Water, Future Technologies & Smart City, Digital Industrialization, Construction, Semiconductors & Integrated Circuits, Intelligent Agriculture, New Energy, Low-altitude Aircraft & Aerospace, Transportation & Delivery, New Materials, Research & Education, Entrepreneurship & Financial Services |
| For Visitors |
Eligibility : Trade & general public
Method of admission : Free / Others : Only free before fair opening For details, please contact the organizer directly. |
| Organizer |
Shenzhen Zhenwei International Exhibition Co., Ltd.
Address : Room 705 and 706, Tianshu Building, Xinggang Tongchuanghui, NO. 6099, Baoan Avenue, Baoan District, Shenzhen City, Guangdong Province, China Department : Visitor Service Person : Lucia Luo Tel : +86-15273751013 E-mail : LCF@zhenweiexpo.com |
| Industry |
|
| Frequency | Annual |
| last fair information |
2025 year Total number of visitors : 100000 （including ： 5000 foreign visitors） Total number of exhibitors : 5000 （including ： 100 foreign exhibitors） Expected floor size : 40,000 sq.m. Data Certified : UFI The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | March 12, 2026 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
