Online Trade Fair Database (J-messe)
Global Electronic Intelligent Manufacturing Show - Vietnam
Date | November 20, 2025 - November 22, 2025 |
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Location |
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Venue |
ICE Ha Noi - 94 Tran Quoc Toan, Hoan Kiem
Expected floor size :10,000 sq.m.
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Items to be exhibited | Electronic Components and Wire Harnesses; Surface Mount Equipment and Testing and Measurement Devices; PCB/PCBA; Factory Support Equipment and Related Materials; Precision Processing Parts and Automation Equipment; VIOE and Optoelectronics |
For Visitors |
Eligibility : Trade only
Method of admission : Free For details, please contact the organizer directly. |
Organizer |
Global Sources
Address : 458, Nguyen Thi Minh Khai Department : Vietnam Show Team Person : Mr Pham Huy Hoai Tel : +84-28-7101-2828 E-mail : phamhuyhoai@globalsources.com |
Message from organizer | Global Electronic Intelligent Manufacturing Show - Vietnam is a premier international platform for sourcing products directly from Asian manufacturers. This must-attend event brings together over 250 booths and 200 exhibitors showcasing their latest offerings to a targeted audience of 7,000 direct buyers. Leveraging Global Sources' 52-year legacy in facilitating global trade, GEIMS offers an unparalleled opportunity for suppliers to connect with qualified buyers. |
Industry |
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Frequency | Annual |
last fair information |
2024 year Total number of visitors : 5227 (including : 1359 foreign visitors) Total number of exhibitors : 157 (including : 71 foreign exhibitors) Expected floor size : 16,800 sq.m. The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | August 12, 2025 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.