Online Trade Fair Database (J-messe)
POWER DEVICE & MODULE EXPO [September]
Date | September 17, 2025 - September 19, 2025 |
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Location |
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Venue |
Makuhari Messe |
Items to be exhibited | Technologies for Power Devices, Semiconductor Materials & Components, Manufacturing & Inspection Equipment, Analysis & Testing, Power Modulation Technologies, EMC & Noise Countermeasures, Thermal Management(Heat Dissipation & Cooling), Control, Drive, Sensing, Power Modules |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
RX Japan Ltd.
Tel : +81-3-6739-4102 E-mail : inj.jp@rxglobal.com |
Message from organizer |
Power Device and Module Expo newly launched in January 2024. The show features all kinds of power device and module components, materials, and manufacturing and testing equipment, providing attendees with an opportunity to discover the latest innovations and advancements in these industries. In addition to featuring an array of power module products, the expo will also offer attendees the chance to connect with industry leaders and explore potential partnerships and collaborations. With a focus on the automotive, energy, railroad, and industrial equipment sectors, the Power Device and Module Expo is a must-attend event for any company looking to stay at the forefront of this dynamic and rapidly-evolving industry.
Held with concurrent exhibitions. |
Industry |
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Frequency | Annual |
last fair information |
2024 year Total number of visitors : 22623 Total number of exhibitors : 244 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | April 1, 2025 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.