Online Trade Fair Database (J-messe)
6th Blockchain Expo TOKYO Spring
| Date | April 15, 2025 - April 17, 2025 |
|---|---|
| Location |
Tokyo
/
Japan
/
Asia
|
| Venue |
Tokyo Big Sight |
| Items to be exhibited | Transaction automation, Traceability, NFTs, Sustainability, Proprietary currency distribution and management, Security |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online / Others : Official Website from here>> https://www.nextech-week.jp/hub/en-gb/visit.html For details, please contact the organizer directly. |
| Organizer |
RX Japan Ltd.
Tel : +81-3-6739-4131 E-mail : nextechweek.jp@rxglobal.com |
| Message from organizer |
BLOCKCHAIN EXPO TOKYO is trade show specialised in Blockchain Technologies. As one of the new technologies, blockchain is getting more attention from various industries such as logistics, pharmaceutical, energy, manufacturing, and finance. This show is held twice in a year under NexTech Week TOKYO, a comprehensive trade show that gathers advanced technologies such as AI, blockchain, and quantum computing. By holding these three shows together, it will create a synergy to attract more professionals from those industries. At BLOCKCHAIN EXPO TOKYO, you will have a great opportunity to introduce your technologies and services to the Japan & Asia market.
Held with concurrent exhibitions. |
| Industry | |
| Frequency | Twice a year |
| last fair information |
2024 year Total number of visitors : 28779 Total number of exhibitors : 321 The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | March 31, 2025 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
