Online Trade Fair Database (J-messe)
MADE IN FRANCE (MIF-Expo)
Date | November 8, 2024 - November 11, 2024 |
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Location |
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Venue |
Paris Expo Porte de Versailles |
Items to be exhibited | Fashion & Accessories, Beauty & Cosmetics, Interiors & Decoration, Gastronomy, and Tourism |
For Visitors |
Eligibility : Trade & general public
Method of admission : Apply/register online / Registration/tickets available at event / Others : Invitation Only For details, please contact the organizer directly. |
Organizer |
Comexposium France
Tel : +33-683-852-260 E-mail : valdec2@gmail.com Inquiry Form : https://www.mifexpo.fr/contact/ |
Message from organizer | MADE IN FRANCE (MIF-Expo) will be held from November 8 to 11, 2024, at the Paris Expo Porte de Versailles. French product manufacturers and consumers come together every year for this large-scale event. Sizeable spots are given to the expertise and excellence of French products, especially in the Fashion & Accessories, Beauty & Health, and Home & Decoration fields. The exhibiton aims to support and promote local production in France, and various key persons gather, including artisans, big businesses, media, and French government officials. This is a must-attend event for industry professionals and general public consumers. |
The representative office, person or agency in Japan |
Promosalons Japon Tel : +81-3-6809-1650 E-mail : japan@promosalons.com |
Industry | |
Frequency | Annual |
last fair information |
2023 year Total number of visitors : 100000 Total number of exhibitors : 1000 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | August 21, 2024 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.