Online Trade Fair Database (J-messe)
Sales & Digital Marketing Week Spring 2025
Date | April 23, 2025 - April 25, 2025 |
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Location |
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Venue |
Tokyo Big Sight, Hall 1-8 |
Items to be exhibited | Sales DX Solutions, SFA, Sales Support Systems, Business Card Management, High Quality Appointments, Inside Sales, Sales BPO, CRM, CX (Customer Experience) Improvement, Sales Enablement, Sales Organization Enhancement, Sales Database, Sales List, Sales DX, Marketing DX, Marketing Automation, CX Improvement, Personalization, Data Analysis & AI Utilization, Social Media Marketing, SEO, Web Advertising Management, Web & Digital Marketing, etc. |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
RX Japan Ltd.
Tel : +81-3-6739-4104 E-mail : cj.jp@rxglobal.com |
Message from organizer |
Products and services related to sales DX, SFA/CRM, inside sales, CX improvement, marketing DX, MA tools, data analysis and AI utilization will be exhibited. Many people involved in sales promotion/planning, marketing, PR/promotion, sales promotion and sales will attend the exhibition, making it possible to have more precise business discussions. It will also be an ideal venue for marketing and sales activities, from lead generation to uncovering hot leads and converting them into deals.
Held with concurrent exhibitions. |
Industry | |
Frequency | Annual |
last fair information |
2024 year Total number of visitors : 53916 Total number of exhibitors : 875 The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | January 29, 2025 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.