SILMO Paris 2024 - International Optics and Eyewear Trade Fair

Date September 20, 2024 - September 23, 2024
City / Country Paris / France / Europe・CIS
Venue Paris Nord Villepinte
Items to be exhibited Frames, sunglasses, lens, glasses accessories, inspection equipment & processing machine, contact lens, related software
For Visitors Eligibility : Trade only
Method of admission : Apply/register online
For details, please contact the organizer directly.
Organizer COMEXPOSIUM
Tel : +33-1-76-77-1644
E-mail : victor.spahn@comexposium.com
Message from organizer The number of Japanese exhibitors at Silmo Paris, one of the largest eyewear and optical equipment trade fairs in Europe, is outstanding compared to other exhibitions in Europe and the United States. This is probably because Japanese products are recognized in Paris, the center of fashion, as the first step to advance into Europe and the United States, and Japanese high quality and sophisticated designs are loved by top buyers in France, Europe, and the United States. We look forward to seeing you at Silmo Paris, which is attracting attention from around the world.
The representative office, person or agency in Japan PROMOSALONS JAPON
Tel : +81-3-6809-1650
E-mail : mkogama@promosalons.com
Industry
Frequency Annual
last fair information 2023 year
Total number of visitors : 31437
Total number of exhibitors : 929
Expected floor size : 75,000 sq.m.
The past records may include concurrent/joint exhibits.
Official website For more detailed information of the trade fair, please check the official website External site: a new window will open. of the individual organizer.
last update February 15, 2024

Japanese

A modal window will open.
A modal window will open.
A modal window will open.

Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.