Online Trade Fair Database (J-messe)
TECHNO-FRONTIER 2024 DX In-Factory
| Date | July 24, 2024 - July 26, 2024 |
|---|---|
| City / Country |
Tokyo
/
Japan
/
Asia
|
| Venue |
Tokyo Big Sight East Exhibition Halls |
| Items to be exhibited | CAD/CAM/CAE, PLM/PDM, 3D-Printer,AR/VR,Technology Management Tool (Document/Patent/BOM) |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Japan Management Association
Tel : +81-3-3434-1988 E-mail : tf@jma.or.jp |
| Message from organizer |
This is a comprehensive exhibition of systems that support the "digital transformation of the engineering sector," from CAD/CAM/CAE, which are essential tools for product design, to technical information management and management support tools. TECHNO-FRONTIER is highly regarded as a collection of elemental technologies essential for the development and design of all kinds of products, including industrial machinery, precision equipment, and automobiles, and many engineers visit the show every year in search of newer technologies. The show is highly regarded as a collection of essential elemental technologies for the development and design of all kinds of products, including industrial machinery, precision equipment, and automobiles.
Held with concurrent exhibitions. |
| Industry | |
| Frequency | Annual |
| last fair information |
2023 year Total number of visitors : 33940 Total number of exhibitors : 420 The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | December 15, 2023 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
