Online Trade Fair Database (J-messe)
C-Touch & Display Shenzhen 2024
Date | November 6, 2024 - November 8, 2024 |
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City / Country | Shenzhen / China / Asia |
Venue |
Shenzhen World Exhibition & Convention Center |
Items to be exhibited | Display screen, touch screen, cover glass / UTG, materials and manufacturing equipment, commercial display application products, automotive display, mini/micro LED, OLED, smart cockpit |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
RX Kuozhan
Person : Edison Li Tel : +86-21-2231-7018 E-mail : edison.li@rxglobal.com |
Message from organizer |
C-TOUCH & DISPLAY SHENZHEN, as a world's leading event with an integration of global resources in new display, smart touch panel and other downstream application sectors, aims to promote the efficient connection, technological innovation and business co-operation between upstream and downstream enterprises to foster new businesses and advance the sustainable development of the global display and touch industry. Concurrent with: Commercial Display, Film & Tape Expo, NEPCON ASIA, AWC
Held with concurrent exhibitions. |
The representative office, person or agency in Japan |
<Japanese Exhibitor Contact> RX Japan Ltd. Department : ISG Tel : +81-80-3357-2546 E-mail : natsumi.inoue@rxglobal.com |
Industry |
|
Frequency | Annual |
last fair information |
2023 year Total number of visitors : 62003 Total number of exhibitors : 916 Data Certified : ufi The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | August 28, 2024 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.