Online Trade Fair Database (J-messe)
COMNEXT 2023
| Date | June 28, 2023 - June 30, 2023 |
|---|---|
| City / Country |
Tokyo
/
Japan
/
Asia
|
| Venue |
Tokyo Big Sight, Japan |
| Items to be exhibited | COMNEXT, formerly Communications and Broadcasting Week, is an international event featuring the latest advancements in next-generation communication technologies. Scheduled from June 28 to 30, 2023, at the Tokyo Big Sight in Japan, the event will showcase cutting-edge technologies such as 6G, local 5G, IoT, optical communications, and 8K video transmission. As the successor to the popular Fiber Optics Expo (FOE), COMNEXT promises to offer even more exciting opportunities for networking, knowledge sharing, and innovation. Attendees can interact with products such as 8K displays and explore solutions related to Edge AI, satellite communication, Wi-Fi 6, IoT security, and more. Whether you are an industry professional or simply interested in staying on top of the latest developments in communication technologies, COMNEXT is the place to be. The event brings together industry-leading professionals worldwide to showcase the latest breakthroughs and share insights on emerging trends. |
| For Visitors |
Eligibility : Trade & general public
Method of admission : Free For details, please contact the organizer directly. |
| Organizer |
RX Japan Ltd
Address : 18F Shinjuku-Nomura Bldg., 1-26-2 Nishishinjuku, Shinjuku-ku, Tokyo 163-0570, Japan Person : Yumi Nozaki Tel : +81-3-3349-8568 E-mail : cbw-eng.jp@rxglobal.com |
| Industry | |
| Frequency | Annual |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | March 28, 2023 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
