Online Trade Fair Database (J-messe)
LASER World of PHOTONICS CHINA 2023
| Date | July 11, 2023 - July 13, 2023 |
|---|---|
| City / Country |
Shanghai
/
China
/
Asia
|
| Venue |
National Exhibition and Convention Center (NECC) |
| Items to be exhibited | Laser and Optronics, Optics, Sensors Test and Measurement, Optical Manufacturing Technology, Laser Production Engineering, Laser Medical and Biotechnology, Imaging and Illumination, Related Services |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Messe Muenchen GmbH / MMI (Shanghai) Co., Ltd.
Tel : +49-89-949-20361 E-mail : info@world-of-photonics-china.com |
| Message from organizer |
Based on the expertise of LASER World of PHOTONICS, the leading trade show in the industry, which features the latest technologies and products from the world's top manufacturers, this is a high-profile industry trade show held in Shanghai, the center of China's optical industry, since 2006. Held with concurrent exhibitions.
Held with concurrent exhibitions. |
| The representative office, person or agency in Japan |
Messe Muenchen Japan Office Tel : +81-3-6402-4583 E-mail : info@messe-muenchen.jp Inquiry Form : https://www.messe-muenchen.jp/inq.php |
| Industry | |
| Frequency | Annual |
| last fair information |
2021 year Total number of visitors : 79453 Total number of exhibitors : 1094 Expected floor size : 63,500 sq.m. Data Certified : ufi The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | February 21, 2023 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
