Online Trade Fair Database (J-messe)
CTEF 2023 - Shanghai International Chemical Equipment Fair
Date | August 23, 2023 - August 25, 2023 |
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Location |
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Venue |
Shanghai New International Expo Center |
Items to be exhibited | Complete Chemical Plant and Equipment, Separation, Filtration, Distillation, Extraction, Purification, Crystallization Equipment, Drying, Crushing, Mixing Equipment, Mass Transfer Equipment, Heat Transfer, Heat Exchange, Refrigeration, and Other Heat Treatment Equipment, Industrial Cleaning & Anti-corrosion Equipment Technology, Equipment Repair, Maintenance and Management, Storage & Transportation, Packaging Technology and Pressure Vessels, Pumps, Valves, Pipelines and Other Fluid Machinery Equipment, Sealing Equipment & Accessories, Instrumentation & Industrial Automation Equipment, Process Control System and Software, Industrial Wastewater Treatment Equipment, Industrial Waste Gas Treatment Equipment, Solid Waste Treatment Equipment |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
Zhenwei International Exhibition Co., Ltd.
Address : Room 403, No.2433 Xingangdong Road, Haizhu District, Guangzhou, China Tel : +86-20-8989-9350 E-mail : ctef@zhenweiexpo.com |
Message from organizer | Held with concurrent exhibitions. |
Industry |
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Frequency | Annual |
last fair information |
2020 year Total number of visitors : 30000 Total number of exhibitors : 800 Expected floor size : 50,000 sq.m. Data Certified : ufi The past records may include concurrent/joint exhibits. |
Official website |
For more detailed information of the trade fair, please check the official website
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last update | June 16, 2023 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.