AWK 2023 - Automotive World Korea

Date April 12, 2023 - April 14, 2023
City / Country Seoul / Korea / Asia , Real and online
Venue COEX
Items to be exhibited Automotive control systems, semiconductor and electronic component ECU manufacturing, and inspection equipment and technology, sensors and camera modules, connected and car manufacturing equipment and technology, automotive manufacturing tools, security and simulation systems, EMC and noise reduction components, automated driving technology, and solutions, and other automotive manufacturing-related equipment and materials
For Visitors Eligibility : Trade only
Method of admission : Apply/register online
For details, please contact the organizer directly.
Organizer Reed K. Fairs Ltd.
Tel : +82-2-554-3010
E-mail : haeyong.hong@rxkfairs.com
Message from organizer Held with concurrent exhibitions.
The representative office, person or agency in Japan RX ISG Japan
Tel : +81-70-1509-9881
E-mail : marina.nemoto@rxglobal.com
Industry
Frequency Annual
last fair information 2019 year
Total number of visitors : 13000
Total number of exhibitors : 320
The past records may include concurrent/joint exhibits.
Official website For more detailed information of the trade fair, please check the official website External site: a new window will open. of the individual organizer.
last update May 2, 2022
A modal window will open.
A modal window will open.
A modal window will open.

Please choose one of the following feedbacks for an improvement in quality of JETRO's "J-messe".

Thank you for your cooperation.

Please choose the degree of usefulness.

Failed register the evaluation.

It is an article that has already been evaluated.

It can not be evaluated.

invalid access.

Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.