|Date||Date of Registration : Aug 18, 2010
Date of Revision : Aug 15, 2011
|Country / Area||Uusimaa (Southern Finland), Finland|
3109 Analytical instruments, parts there of and accessories
3111 Mineral fuels testing instruments, material testing instruments, parts there of and accessories
3106 Laboratory apparatuses, furniture & consumables, parts there of and accessories
|Target Country / Area||All Countries / Areas|
*Attention: JETRO shall not take any responsibility for the contents provided by users. Please take note of the fact that JETRO leaves the exactness and reliability of the contents to users' judgment.
Analytical instruments and methods for thin film boundary analys
<< DESCRIPTION >>
We have currently a patent pending for a method and facility for analysing disordered materials, including the boundaries between thin films and substrate. Theory was developed and test computations for real materials were carried out.
Our strength is on the theoretical knowledge on materials science. This includes the x-ray and neutron diffraction and scattering theory, computational and experimental solid-state physics and computational modelling and analysis methods.
We collaborate with the leading research centres and international universities around the world.
** Examples of Your Technology Adoptions **
Target is to develop measurement chambe(s)r and analytical software for characterization of technologically important materials and components. Examples are thin films on semiconductor wafers. Other examples are crystalline solid-solutions, such as lead-zirconate-titanate (PZT) ceramics.
** Partner Qualifications **
State-of-the-art x-ray diffractometers, ability to design and construct measurement chambers in collaborative manner.
Suitable partners could be instrument manufacturers. Also software development is crucial for the project.
<< EXAMPLES OF ACTUAL APPLICATIONS >>
Thin film boundaries, e.g., thin films on semiconductor wafers
Domain boundaries in ferroelectric and magnetic materials