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JAPANESE

Technology of Latent defect detection function (Japan only)

Proposal Number : 1160718       Provide technologies/know-how
Date Date of Registration : Dec 07, 2017
Date of Revision : Aug 15, 2019
Country / AreaHiroshima, Japan 
Proposal Category 8601 Computer hardware, peripherals, accessories, computer software
3105 Electrical measuring instruments & data process, parts there of and accessories
Target Country / Area JAPAN

*Attention: JETRO shall not take any responsibility for the contents provided by users. Please take note of the fact that JETRO leaves the exactness and reliability of the contents to users' judgment.

Detail Description

Technology of Latent defect detection function (Japan only)

Patent Status
Progress of formalities Registered
Country / Area in Which Registered Japan
Registered No. 3382240

Progress of formalities Registered
Country / Area in Which Registered Japan
Registered No. 5753301

Progress of formalities Registered
Country / Area in Which Registered Japan
Registered No. 6154523

Progress of formalities Pending
Country / Area in Which Registered Japan
Registered No. 2018-199560
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