Online Trade Fair Database (J-messe)
|Date||June 19, 2019 - June 21, 2019|
|City / Country||Tokyo / Japan / Asia|
Tokyo Big Sight (Tokyo International Exhibition Center)
|Items to be exhibited||SP products, Novelty products, Anniversary gifts, Premium gifts, Digital SP goods, Eco-friendly novelty goods, Signs, In-store promotion tools, Product packages, Name printing srevices, Merchandising consulting, etc.|
Eligibility : Trade only
Method of admission : Apply/register online / Others : Admission fee: JPY 5,000/person without invitation ticket.
For details, please contact the organizer directly.
Reed Exhibitions Japan Ltd.
Tel : +81-3-3349-8505
E-mail : firstname.lastname@example.org
Inquiry Form : https://www.sp-world.jp/sse_inv/
|Message from organizer||
SALES SUPPORT EXPO gathers all kind of sales support services. It is the best place to meet potential business partners as well as have in depth business meetings with them on-site. Including concurrent shows, 630 exhibitors and 43,000 visitors are expected to gather.
Held with concurrent exhibitions.
|Frequency||Twice a year|
|last fair information||
Total number of visitors : 88945
Total number of exhibitors : 579
Data Certified : JECC(Japan exhibition Certification Council)(2018)
The past records may include concurrent/joint exhibits.
|Official website||For more detailed information of the trade fair, please check the official website of the individual organizer.|
|last update||May 10, 2019|
Please choose one of the following feedbacks for an improvement in quality of JETRO's "J-messe".
Thank you for your cooperation.
Please choose the degree of usefulness.
Failed register the evaluation.
It is an article that has already been evaluated.
It can not be evaluated.
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.