Online Trade Fair Database (J-messe)
AAP 2021 - Experience National Conference & Exhibition
Date | October 8, 2021 - October 11, 2021 |
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City / Country | Philadelphia / U.S.A. / North America , Online only |
Venue |
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Items to be exhibited | Allergy/Pulmonology, Cardiology, Computer Software/Hardware, Dental Products, Dermatological, Developmental Toys/Books, Diagnostics, Education/Patient Education, Eye, Ear, Nose, Throat, Financial Management Services, Gastrointestinal, Governmental Organization, Health Care Products, Home Care, Hospital Services, Infant Feeding, Infectious Diseases, Insurance Programs, Market Research, Marketing Services, Medical Supplies/Equipment, Neurological/Psychiatric/Learning Disturbances, Nutrition/Food, Office Management Systems, Other, Pain/Temperature Control/Analgesics, Pharmaceutical-Diagnostic, Pharmaceutical-Therapeutic, Professional Services, Publications/Books/Journals, Recruitment/Staffing, Safety Products, Skin & Hair Care Products, Surgical Instruments, Therapeutic Devices, Vaccines |
For Visitors |
Eligibility : Trade only
For details, please contact the organizer directly. |
Organizer |
American Academy of Pediatrics (AAP)
Address : 345 Park Boulevard Itasca, IL 60143, USA Tel : +1-800-433-9016 Inquiry Form : https://www.aap.org/en/pages/contact-us/contact-national-headquarters/ |
Industry | |
Frequency | Annual |
last fair information |
2019 year Total number of visitors : 14449 (including : 2065 foreign visitors) Total number of exhibitors : 109 The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | September 30, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.