Online Trade Fair Database (J-messe)
Total Solution Exhibition for Electronic Equipment 2021
| Date | October 27, 2021 - October 29, 2021 |
|---|---|
| City / Country |
Tokyo
/
Japan
/
Asia
|
| Venue |
Tokyo Big Sight South Exhibition Hall |
| Items to be exhibited | Electronic circuit technology, high-density mounting technology, electronic component mounting technology, new circuit formation technology, electrical / optical transmission technology, sensor technology, semiconductor / electronic component, high-performance textile, optical device / laser technology, deep ultraviolet (DUV) market / State-of-the-art LED application technology, image processing / sensing technology |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Japan Electronics Packaging and Circuits Association
Tel : +81-3-5310-2020 E-mail : show@jpca.org Inquiry Form : https://jpca.jp/contact/ |
| Message from organizer |
Comprehensive exhibition of technology embodying 5G, automobile, IoT, robots, wearable, etc.
Held with concurrent exhibitions. |
| The representative office, person or agency in Japan |
JTB Communication Design, Inc. Address : Celestine Shiba Mitsui Building, 3-23-1, Shiba, Minato-ku, Tokyo, Japan 105-8335 Tel : +81-3-5657-0767 E-mail : jpcashow@jtbcom.co.jp |
| Industry |
|
| Frequency | Annual |
| last fair information |
2019 year Total number of visitors : 44110 Total number of exhibitors : 507 （including ： 20 foreign exhibitors） The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | June 2, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
