Online Trade Fair Database (J-messe)
INTERPHEX 2021 - Pharmaceutical, Biotechnology, and Device Development and Manufacturing Event
Date | October 19, 2021 - October 21, 2021 |
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City / Country | New York / U.S.A. / North America |
Venue |
Jacob K. Javits Convention Center |
Items to be exhibited | Pharmaceutical, biopharmaceutical, and medical device innovation, technology, and knowledge |
For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
Organizer |
Reed Exhibitions (RX)
Address : 201 Merritt 7 , Norwalk, CT 06851 Tel : +1-203-840-5648 E-mail : inquiry@interphex.com |
Message from organizer | America's largest pharmaceutical manufacturing technology exhibition will be held at the New York Javits Center for three days from October 19-21, 2021. INTERPHEX, celebrating its 40th anniversary, gathers approximately 10,500 domestic and foreign industry experts and more than 500 exhibitors as the premier event for the development and manufacture of pharmaceuticals, biotechnology, and medical devices. And this huge market is expected to continue to expand in the future, and the market growth rate from 2014 to 2020 is expected to be 4.8% per year. |
The representative office, person or agency in Japan |
Reed ISG Japan KK Tel : +81-80-3497-7613 E-mail : mai.kijima@rxglobal.com |
Industry |
|
Frequency | Annual |
last fair information |
2019 year Total number of visitors : 10500 Total number of exhibitors : 500 The past records may include concurrent/joint exhibits. |
Official website | For more detailed information of the trade fair, please check the official website of the individual organizer. |
last update | September 29, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.