Online Trade Fair Database (J-messe)
INTERNATIONAL TECHNICAL EXHIBITION ON IMAGE TECHNOLOGY AND EQUIPMENT 2020
|Date||December 2, 2020 - December 4, 2020|
|City / Country||Yokohama (Kanagawa) / Japan / Asia|
|Items to be exhibited||Lighting apparatuses for image input, Cameras, Lens, Image sensors, Image input / output boards, Other image output instruments, Image processing units, Image analytical systems, Image processing boards, Image processing software, Display units, Hard copying units, Image storage, Image compressing units / software, Disk recorder, Video conference systems, Communication boards, Medical image processing apparatuses / software, Transmit systems, Lighting equipment for various image input, Security, 3D, Deep learning, ITS (Intelligent Transport systems), Infrastructure Improvement, Industry-University Cooperation, etc.|
Eligibility : Trade & general public
Method of admission : Apply/register online / Registration/tickets available at event
For details, please contact the organizer directly.
|Organizer||The council of image technology and equipment in japan|
|Message from organizer||Held with concurrent exhibitions.|
|The representative office, person or agency in Japan||
Advanced Communication Media Co., Ltd.
Tel : +81-3-3367-0571
E-mail : email@example.com
|Official website||For more detailed information of the trade fair, please check the official website of the individual organizer.|
|last update||July 8, 2020|
Please choose one of the following feedbacks for an improvement in quality of JETRO's "J-messe".
Thank you for your cooperation.
Please choose the degree of usefulness.
Failed register the evaluation.
It is an article that has already been evaluated.
It can not be evaluated.
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.