Online Trade Fair Database (J-messe)
|Date||December 9, 2020 - December 11, 2020|
|City / Country||Tokyo / Japan / Asia|
Tokyo Big Sight (Tokyo International Exhibition Center)
Expected floor size ：4,000 sq.m.
|Items to be exhibited||[Materials]functional nano thin film,gold / silver colloid,conductive materials,insulator thin film, electromagnetic pulse shield materials, organic electro luminescence,photonic crystal,photo catalyst,various catalyst,intelligent materials,biocompatible materials,cell sheet, paints/painting, surface-active agent,water shedding/hydrophilic materials, anti-fouling/anti-bacterium materials[Surface rocessing/Coating/Joint Technology]water shedding/hydrophilic surface processing, rheology, alumite,plating,blast processing,grinding / polish,CMP,YAG laser welding, bossment,etching,[Electronic Parts/Devices]FED,SED,organic electro luminescence display,flat panel,ink jet,various coating products, photonic switch/sensor arious devices,photon[Surface Processing/Manufacturing/Measuring Instruments]corona/ozone/plasma surface processing instruments,surface tension / shape/ roughness measuring instruments,contact angle measuring instruments etc|
Eligibility : Trade only
Method of admission : Apply/register online
For details, please contact the organizer directly.
Secretariat of ASTEC Executive Committee c/o JTB Communication Design,Inc.
Tel : +81-3-5657-0850
E-mail : email@example.com
|Message from organizer||Held with concurrent exhibitions.|
|last fair information||
Total number of visitors : 47692
Total number of exhibitors : 127
The past records may include concurrent/joint exhibits.
|Official website||For more detailed information of the trade fair, please check the official website of the individual organizer.|
|last update||June 24, 2020|
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Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.