Online Trade Fair Database (J-messe)
Tooltech 2021 (*Postponed)
| Date | June 17, 2021 - June 23, 2021 |
|---|---|
| City / Country |
Bangalore
/
India
/
Asia
|
| Venue |
Bangalore International Exhibition Centre (BIEC) |
| Items to be exhibited | Cutting Tools, Forming Tools, Abrasive and Polishing Tools, Tooling Systems, Workholding, Automation for Storage & Transport, Components for Robotics & Automation, Attachments, Accessories & Sub-systems, Mechanical Elements and Components, Hydraulic and Pneumatic Systems and Elements, Electrical & Electronic Equipment, Feeding Systems, Testing Machines, Measuring, Inspection & Quality Control, Dies & Moulds, Production Control & Networks, Controls, Drives and Systems, Shop Equipment, Waste Disposal Equipment, Lubrication & Coolant, Welding Material & Accessories, Raw Materials, CAD/CAM, etc. |
| For Visitors |
Eligibility : Trade only
Method of admission : Apply/register online For details, please contact the organizer directly. |
| Organizer |
Indian Machine Tool Manufacturers Association (IMTMA)
Address : 10th Mile, Tumkur Road, Madavara Post, Bangalore - 562 123, Karnataka (India) Tel : +91-80-6624-6600 E-mail : imtma@imtma.in Inquiry Form : https://www.imtex.in/index.php?page=contact_us |
| Message from organizer |
*Postponed to January 2022
Held with a concurrent exhibition. |
| Industry |
|
| Frequency | Annual |
| last fair information |
2019 year Total number of visitors : 91446 Total number of exhibitors : 1222 Expected floor size : 80,000 sq.m. The past records may include concurrent/joint exhibits. |
| Official website |
For more detailed information of the trade fair, please check the official website
of the individual organizer.
|
| last update | June 24, 2021 |
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.
