Online Trade Fair Database (J-messe)
|Date||January 15, 2020 - January 17, 2020|
|City / Country||Tokyo / Japan / Asia|
Tokyo Big Sight
|Items to be exhibited||Resins, Metals, Alloys, Molding/Processing Technologies, Lightweight Components, Design/Development Tools, Design/Simulation tools|
Eligibility : Trade only
Method of admission : Apply/register online / Others : Admission fee: JPY 5,000/person without invitation ticket.
For details, please contact the organizer directly.
Reed Exhibitions Japan Ltd.
Tel : +81-3-3349-8502
E-mail : email@example.com
|Message from organizer||Lightweight technologies play an significant role in improvement of fuel efficiency without giving up enhancing safety and comfort. "Automotive Lightweight Technology Expo" is a unique tradeshow featuring all kinds of Components/Materials and Molding/Processing Technologies for automotive weight reduction. Automotive OEMs and Tier 1 suppliers visit the exhibition to find the latest technologies. This is the must-attend show for all professionals engaged in automobile development and the best place to promote your products to the automotive industry.|
|last fair information||
Total number of visitors : 37660
Total number of exhibitors : 1002
The past records may include concurrent/joint exhibits.
|Official website||For more detailed information of the trade fair, please check the official website of the individual organizer.|
|last update||May 27, 2019|
Please choose one of the following feedbacks for an improvement in quality of JETRO's "J-messe".
Thank you for your cooperation.
Please choose the degree of usefulness.
Failed register the evaluation.
It is an article that has already been evaluated.
It can not be evaluated.
Information contained herein are subject to amendment, postponement and cancellation by the organizer at any time without notice.
For more detailed information on each event, please check the official website of its organizer. JETRO shall not be responsible for any loss or inconvenience caused by actions taken based the information within J-messe.